bontiss | vector network analyzers

VECTOR NETWORK ANALYZERS

Our broad range of CRXVT vector network analyzers supports RF, microwave and millimeter-wave measurement solutions covering 1 MHz to 170 GHz.

Built on more than 30 years of RF and microwave engineering expertise and over two decades of experience in VNA development, industrial manufacturing and international supply.

BROAD PRODUCT RANGE

Choose from one-port, compact, multiport and benchtop vector network analyzers, with frequency coverage extending into the millimeter-wave range.
PROFESSIONAL MEASUREMENT CAPABILITY

Characterize reflection, transmission, gain, isolation, impedance and other S-parameters using configurations designed for RF, microwave and millimeter-wave applications.
PRACTICAL TOTAL COST

Build the required measurement configuration without investing in unnecessary capabilities. Select the instrument, software and supporting hardware appropriate for the application.
SCALABLE CONFIGURATION

Add software capabilities, automatic calibration modules, additional test ports or frequency extension as measurement requirements grow.
LABORATORY, PRODUCTION AND FIELD USE

Configure the system for engineering laboratories, automated test stations, production environments, technical education or portable measurements.
AUTOMATION AND SYSTEM INTEGRATION

Integrate the analyzer into verification stations, production lines and customer-specific measurement systems using remote control and automated workflows.

EXPLORE OUR PRODUCT RANGE

THREE PARTNERSHIP MODELS FOR ASEAN

To expand the CRXVT product range across ASEAN, we have created several mutually beneficial cooperation models for regional partners.

These structures can be tailored to the partner’s market position, technical skills, and goals—ranging from distributing finished instruments to local assembly and licensed production under the CRXVT/Bontiss brand or the partner’s own brand.

Select a cooperation model aligning with your market, manufacturing capacity, and business aims—from ready-to-sell instruments to licensed local manufacturing.

DISTRIBUTE READY-MADE PRODUCTS

Purchase complete, tested instruments and measurement systems for resale, customer projects, or direct operation.

Broad ready-made product range
Competitive market positioning
Application-specific configurations
Commercial and technical documentation

ASSEMBLE LOCALLY

Build selected instruments and measurement systems locally using supplied core modules, software and technical documentation.

Local partner contribution may include:

Enclosures and mechanical parts
Standard electronic components
Final assembly and configuration
Testing, calibration and quality control
Local branding if necessary and delivery

MANUFACTURE UNDER LICENCE

Set up local manufacturing of specific instruments through a licensing and technology transfer agreement.

The licensed manufacturing model may encompass:

Manufacturing and technical documentation
Software and licensing
Component sourcing and production requirements
Testing, calibration and quality procedures
Engineering and production support

OUR PRODUCTS

Explore our range of vector network analyzers, including optional software measurement features and hardware options.

Choose a category to see available configurations and models, sorted by frequency range, number of measurement ports, instrument format, and measurement capabilities.

Frequency Range

Choose the frequency coverage required for your current measurements while allowing for future applications.
Number of Ports

Select a one-port, two-port, four-port or multiport configuration according to the device under test and measurement workflow.
Instrument Format

Choose a compact, benchtop or modular configuration based on the available workspace, mobility and system-integration requirements.
Application Requirements

Consider dynamic range, measurement speed, calibration method, automation requirements and optional software functions.

ONE-PORT VNA

Compact USB-powered vector network analyzers for reflection measurements, cable testing and impedance characterization.

The analyzers can be connected directly to the device under test, reducing cable-related errors and simplifying portable, laboratory and automated measurement setups.

You can also combine multiple instruments for synchronized multiport measurements.

Models: X606 and X615

X606

1-PORT SERIES VNA

A compact one-port analyzer for RF reflection measurements from 1 MHz to 6 GHz. Its lightweight, USB-powered design suits direct connection to the device under test, portable measurements, and integration into automated test systems.

Frequency range: 1 MHz to 6 GHz
Test port: 1 × N-type male, 50 Ω
Dynamic range: 119 dB typ.
Output power: -40 to 0 dBm typ.
Measurement time: 100 μs per point
Control and power: USB

X615

1-PORT SERIES VNA

A compact one-port analyzer extending measurement coverage to 15 GHz. Available with N-type or 3.5 mm test connectors, it is designed for RF and microwave component testing, field measurements and automated measurement systems.

Frequency range: 85 MHz to 15 GHz
Test port: 1 × N-type or 3.5 mm, 50 Ω
Dynamic range: up to 125 dB typ.
Output power: -25 to 0 dBm
Measurement time: 170 μs per point
Control and power: USB

HW/SW OPTIONS

FOR BOTH X606 AND X615

SOFTWARE OPTIONS:

AFR-X -Automatic Fixture Removal. Remove the influence of fixtures and interconnections from measurement results.
IMH-X - Intermodulation Measurements. Evaluate intermodulation products and nonlinear behavior.
ACP-X - Advanced Compression Point Measurements. Characterize amplifier compression across frequency and power.

HARDWARE SUPPORT:

Automatic Calibration Modules. Faster and more repeatable calibration of the measurement setup.

COMPACT VNA

Full-featured vector network analysis in a compact form factor.

These instruments are suitable for laboratory benches, automated test systems, educational environments, portable measurement setups and integration into custom solutions.

The range includes configurations for different frequency bands and measurement requirements.

Models: TR1300x, X1754, X1201, X1203, X1204, X1206, X1209, X1218, X1244, X1444

TR1300x

ENTRY-LEVEL 2-PORT VNA

Cost-effective two-port analyzer for one-way transmission and reflection measurements up to 1.3 GHz.

Frequency range: 0.3 MHz to 1.3 GHz
Test ports: 2 × N-type female, 50 Ω
Measured parameters: S11, S21
Dynamic range: 130 dB typ.
Output power: -55 to +3 dBm
Measurement time: 150 μs per point

X1754

75 Ω 2-PORT VNA

Compact 75 Ω analyzer for cable, broadcast and telecommunications measurements up to 4 GHz.

Frequency range: 100 kHz to 4 GHz
Test ports: 2 × N-type female, 75 Ω
Measured parameters: S11, S21, S12, S22
Dynamic range: 133 dB typ.
Output power: -50 to +10 dBm
Measurement time: 24 μs per point

X120x

2-PORT COMPACT SERIES

2-port VNAs with selectable frequency ranges of 1.5/3/4.5/6.5/9 GHz for RF development, testing, and automated measurement systems.

Frequency range: 9 kHz to 9 GHz
Test ports: 2 × N-type female, 50 Ω
Dynamic range: up to 137 dB typ.
Output power: −55 to +5 dBm
Measurement time: 24 μs per point
Control: USB-C

X1218

18 GHz COMPACT VNA

High-performance compact two-port analyzer for RF and microwave measurements up to 18 GHz.

Frequency range: 100 kHz to 18 GHz
Test ports: 2 × N-type female, 50 Ω
Dynamic range: 135 dB typ. up to 8 GHz
Output power: −45 to +10 dBm
Measurement time: 24 μs per point
Control: USB

X1244, X1444

44 GHz COMPACT VNA

Compact two-port and four-port analyzers for advanced microwave measurements and automated testing up to 44 GHz.

Frequency range: 10 MHz to 44 GHz
Test ports: 2 or 4 × 2.4 mm male, 50 Ω
Dynamic range: 135 dB typ.
Output power: −50 to 0 dBm
Measurement time: 22 μs per point
Control: USB

HW/SW OPTIONS

FOR THE COMPACT SERIES

SOFTWARE OPTIONS:

PLS-X - Pulsed Measurements
SPM-X - Spectrum Measurements
AFR-X - Automatic Fixture Removal
IMH-X - Intermodulation Measurements
ACP-X - Advanced Compression Point Measurements

HARDWARE SUPPORT:

Automatic Calibration Modules

MULTIPORT VNA

Integrated multiport vector network analyzers for efficient characterization of devices and assemblies with multiple RF connections.
Available with 6 to 16 test ports, the X709 Series reduces manual reconnections and simplifies automated measurement of antennas, switches, cable assemblies, diplexers, power dividers and other multiport devices.

X709 SERIES

6 TO 16-PORT VNA

A configurable multiport measurement platform combining an integrated RF switching matrix with vector network analysis in a single system.

X709 SERIES MODELS:

X709-06: 6 ports
X709-08: 8 ports
X709-10: 10 ports
X709-12: 12 ports
X709-14: 14 ports
X709-16: 16 ports

Frequency range: 300 kHz to 9 GHz
Test ports: 6–16 × N-type female, 50 Ω
Dynamic range: 140 dB typ.
Output power: −45 to +10 dBm
Measurement time: 24 μs per point
Logical channels: up to 32
Control: USB

HW/SW OPTIONS

FOR THE X709 SERIES

SOFTWARE OPTIONS:

TD-X — Time Domain Measurements. Locate discontinuities and evaluate impedance changes along cables and signal paths.
MXR-X — Mixer Measurements. Measure frequency-converting devices using scalar and vector methods.
AFR-X — Automatic Fixture Removal. Remove fixtures, adapters and interconnections from measurement results.
IMH-X — Intermodulation Measurements. Evaluate intermodulation products and nonlinear device behavior.
ACP-X — Advanced Compression Point Measurements. Characterize amplifier compression across frequency and power.

HARDWARE SUPPORT:

Automatic Calibration Modules. Faster and more repeatable calibration of the measurement setup.

BENCHTOP VNA

High-performance vector network analyzers for advanced laboratory measurements, RF and microwave development, production testing and automated measurement systems.
The series includes 2-port and 4-port configurations with frequency coverage up to 44 GHz, direct receiver access, multiple internal sources and support for frequency-extension systems.

Models/Series:

X2209, X3209, X4209, X2409, X3409, X4409
X2220, X3220, X4220, X2420, X3420, X4420
X5222, X5422
X5244, X5444

X2209 / X3209 / X4209
X2409 / X3409 / X4409

9 GHz BENCHTOP SERIES

High-dynamic-range 2-port and 4-port analyzers for demanding RF measurements and high-speed automated testing.

Frequency range: 100 kHz to 9 GHz
Test ports: 2 or 4 × N-type female, 50 Ω
Dynamic range: 152 dB typ.
Output power: −60 to +15 dBm
Measurement time: 10 μs per point
Measurement points: up to 500,001

Configurations: standard, direct receiver access or frequency-extension support.

X2220 / X3220 / X4220
X2420 / X3420 / X4420

20 GHz BENCHTOP SERIES

Configurable 2-port and 4-port platforms for microwave component development, production testing and extended-frequency measurement systems.

Frequency range: 100 kHz to 20 GHz
Test ports: 2 or 4 × 3.5 mm male, 50 Ω
Dynamic range: 135 dB typ.
Output power: −60 to +10 dBm
Measurement time: 12 μs per point
Measurement points: up to 500,001

Configurations: standard, direct receiver access or frequency-extension support.

X5222 / X5422

ADVANCED 22.5 GHz SERIES

Advanced 2-port and 4-port analyzers with direct access to internal sources and receivers for flexible active and passive device measurements.

Frequency range: 100 kHz to 22.5 GHz
Test ports: 2 or 4 × 3.5 mm male, 50 Ω
Internal sources: 1 or 2
Dynamic range: 144 dB typ.
Output power: −60 to +15 dBm
Measurement time: 10 μs per point

X5244, X5444

ADVANCED 44 GHz SERIES

High-frequency 2-port and 4-port analyzers for precision microwave measurements, active-device characterization and production testing up to 44 GHz.

Frequency range: 10 MHz to 44 GHz
Test ports: 2 or 4 × 2.4 mm male, 50 Ω
Internal sources: 1 or 2
Dynamic range: 140 dB typ.
Output power: −50 to +10 dBm
Measurement time: 10 μs per point

SW OPTIONS

FOR THE BENCHTOP SERIES

TD-X — Time Domain Measurements. Locate discontinuities and analyze signal paths in the time domain.
MXR-X — Mixer Measurements. Characterize mixers, converters, and other frequency-changing devices.
NF-X — Noise Figure Measurements. Measure noise figure and gain of amplifiers and receiver devices.
PLS-X — Pulsed Measurements. Perform point-in-pulse, pulse-profile, and asynchronous pulse measurements on compatible models.
AFR-X — Automatic Fixture Removal. Remove the effects of fixtures, adapters and interconnections.
IMH-X — Intermodulation Measurements. Evaluate intermodulation products and nonlinear behavior.
ACP-X — Advanced Compression Point Measurements. Characterize amplifier compression across frequency and power.

HW OPTIONS

HARDWARE SUPPORT

Automatic Calibration Modules
Frequency Extension Modules
Direct Receiver Access
External source and receiver configurations

Option and hardware availability depend on the selected analyzer configuration.

Automatic

Calibration Modules

Automatic Calibration Modules simplify one-port, two-port and multiport VNA calibration while improving speed, consistency and repeatability.
Factory-characterized calibration standards are stored in the module memory and automatically selected by the analyzer software.А
Configurations are available for 50 Ω and 75 Ω systems with frequency coverage up to 44 GHz.

RF Calibration Modules
XC5206 / XC5209 / XC5409 / XC7204

AUTOMATIC CALIBRATION UP TO 9 GHz

Compact automatic calibration modules for general-purpose RF analyzers, laboratory measurements and automated test systems.

XC7204: 20 kHz to 4 GHz, 75 Ω
XC5206: 20 kHz to 6 GHz, 50 Ω
XC5209: 20 kHz to 9 GHz, 50 Ω
XC5409: 100 kHz to 9 GHz, 50 Ω
Ports: 2 or 4
Connectors: N-type or 3.5 mm

Microwave Calibration Modules
XC5220 / XC5420 / XC5232

AUTOMATIC CALIBRATION UP TO 32 GHz

Two-port and four-port calibration modules for microwave analyzers and higher-frequency measurement configurations.

XC5220: 100 kHz to 20 GHz, 2 ports
XC5420: 100 kHz to 20 GHz, 4 ports
XC5232: 10 MHz to 32 GHz, 2 ports
Impedance: 50 Ω
Connectors: N-type or 3.5 mm
Calibration: one-port, two-port or multiport

44 GHz Calibration Module
XC5244

AUTOMATIC CALIBRATION UP TO 44 GHz

High-frequency two-port calibration module for compact and benchtop microwave analyzers operating up to 44 GHz.

Frequency range: 10 MHz to 40 or 44 GHz
Ports: 2
Impedance: 50 Ω
Connectors: 2.92 mm or 2.4 mm
Calibration: one-port and two-port
Effective directivity: up to 47 dB

6 GHz Auto-Calibration Module
XCB5206

STANDALONE AUTO-CALIBRATION MODULE

For accurate S-parameter measurement of installed coaxial and twisted-pair cable assemblies without requiring a long return test cable.

Frequency range: 20 kHz to 6 GHz
Ports: 2
Impedance: 50 Ω
Connectors: N-type or 3.5 mm
Control: Mini USB
Battery operation: up to 200 hours
Compatible equipment: VNA required

Frequency

Extension Modules

Frequency-extension solutions expand compatible benchtop vector network analyzers into microwave and millimeter-wave frequency ranges up to 170 GHz.
The modules are powered and controlled by the analyzer and support S-parameter measurements, time-domain analysis, balanced measurements and characterization of frequency-converting devices.

XT1854

18 TO 54 GHz FREQUENCY EXTENSION MODULE

Compact frequency-extension module for expanding compatible benchtop VNA configurations up to 54 GHz.

Frequency range: 18 to 54 GHz
Test port: 1 × 1.85 mm male, 50 Ω
Dynamic range: up to 140 dB typ.
Output power: up to +3 dBm
Measurement time: 12 μs per point
System configurations: up to 2 or 4 modules

Compatible VNAs: X4209 / X4409 / X4220 / X4420

We can supply available transmitter and receiver configurations for specialized measurement systems.

XVECTOR Series

50 TO 170 GHz MILLIMETER-WAVE EXTENDERS

For advanced millimeter-wave component development, laboratory research and high-frequency device characterization.

System configurations: up to 2 or 4 modules
Optional attenuation: 0 to -35 dB
Measurement capabilities: S-parameters, balanced and time-domain measurements
Compatible VNAs: X4220 (2-port benchtop VNA), and X4420 (4-port benchtop VNA)

AVAILABLE FREQUENCY BANDS:

XVECTOR 50-75 GHz. WR-15 waveguide, +14 dBm output power, 120 dB dynamic range
XVECTOR 75-110 GHz. WR-10 waveguide, +10 dBm output power, 120 dB dynamic range
XVECTOR 110-170 GHz. WR-06 waveguide, -2 dBm output power, 110 dB dynamic range

PORT EXPANDERS AND RF SWITCHES

High-speed solid-state port expanders increase the number of available VNA measurement ports for multiport devices and complex RF assemblies.
The modules reduce manual reconnections, improve measurement repeatability and simplify integration into automated test systems.

X708-18A / X716-18A

8 AND 16-PORT RF EXPANDERS WITH 2 INPUTS

Broadband solid-state switching modules for expanding two VNA ports into 8 or 16 selectable RF measurement paths.

Frequency range: 10 MHz to 18 GHz
Impedance: 50 Ω
Connectors: N-type female
Insertion loss: ≤10 dB
Signal isolation: ≥92 dB
Maximum switching power: 30 dBm
Switching time: ≤200 ns
Installation: desktop or 19-inch rack
Rack height: 2U for X708-18A; 3U for X716-18A

SYSTEM INTEGRATION

CONTROL AND AUTOMATION

Control the port expander as part of an automated measurement system or operate it as an independent RF switching device.

Control interface: USB
External triggering: BNC trigger inputs
Remote control: VISA library and SCPI commands
Control software: Switch Control
Automatic termination: unused output ports are switched to matched internal loads

MEASUREMENT SOFTWARE

A consistent software environment for instrument control, measurement setup, trace visualization, analysis and result management.

INCLUDED MEASUREMENT SOFTWARE

The included measurement software can also be extended with optional features for specialized measurement tasks.

MEASUREMENT
- S-parameter measurements
- Multiple measurement channels and traces
- Measurement calibration workflow
DISPLAY AND ANALYSIS
- Logarithmic, linear, phase, group-delay and SWR formats
- Smith chart, polar and Cartesian displays
- Markers and limit-line evaluation
WORKFLOW AND DATA
- Saving and recalling instrument configurations
- Measurement data export
- Report-ready trace and result handling
AUTOMATION AND INTEGRATION
- Remote instrument control
- Automated measurement sequences
- Integration with external applications

OPTIONAL MEASUREMENT CAPABILITIES

Extend your VNA with application-specific measurement and analysis capabilities.

Option availability depends on the selected instrument series and configuration.

ACP-X — Advanced Compression Point Measurements

Characterize amplifier compression across frequency and input power.
Available for: all VNA series
AFR-X — Automatic Fixture Removal

Remove the effects of fixtures, adapters and interconnections from measurement results.
Available for: all VNA series
TD-X — Time Domain Measurements

Locate discontinuities, impedance changes and faults in cables, connectors and signal paths.
Available for: X709 and Benchtop Series
SPM-X — Spectrum Measurements

Measure signal levels and analyze spectrum across the supported frequency range.
Available for: selected Compact VNA models
PLS-X — Pulsed Measurements

Characterize RF and microwave devices operating under pulsed stimulus conditions.
Available for: selected Compact VNA models
NF-X — Noise Figure Measurements

Measure noise figure and gain of amplifiers, receivers and other active RF devices.
Available for: Benchtop Series
IMH-X — Intermodulation Measurements

Evaluate intermodulation products and nonlinear behavior of RF and microwave devices.
Available for: all VNA series
MXR-X — Mixer Measurements

Characterize mixers, converters and other frequency-converting devices.
Available for: X709 and Benchtop Series

APPLICATIONS

A versatile selection of compact, multiport, and benchtop VNAs, calibration modules, port expansion, and frequency extension systems for various applications, including:

RF AND MICROWAVE COMPONENTS

Measurement of filters, amplifiers, attenuators, couplers, splitters, mixers and other passive or active components.
ANTENNAS AND FEEDING SYSTEMS

Evaluation of antenna matching, return loss, impedance and transmission characteristics.
CABLES AND CONNECTORS

Verification of cable assemblies, adapters, connectors and interconnection systems.
TELECOMMUNICATIONS

Develop and test components and subsystems for wireless communication infrastructure.
AEROSPACE AND DEFENCE

Characterization of RF and microwave devices, modules and signal paths used in advanced electronic systems.
ELECTRONICS MANUFACTURING

Incoming inspection, production testing, quality control and final product verification.
RESEARCH AND EDUCATION

Laboratory measurements, experimental systems, engineering education and applied RF research.
MILLIMETER-WAVE DEVELOPMENT

Testing of high-frequency components, modules, waveguide devices and emerging millimeter-wave technologies.

NEED HELP SELECTING A VECTOR NETWORK ANALYZER?

Tell us about your frequency range, device type, number of measurement ports and application.
We will help you identify a suitable instrument and prepare the required system configuration.
Send us a request at info@bontiss.com.

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